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build testing circuits more rapidly. this has a failure mode

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where if circuits fail quickly, we'll fail a lot of them very
quickly and not retry for a while. so be it.


svn:r8407
This commit is contained in:
Roger Dingledine 2006-09-17 06:18:06 +00:00
parent 3b0355d3b2
commit b049b1b014
1 changed files with 4 additions and 4 deletions
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8
src/or/circuituse.c
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@ -653,12 +653,12 @@ circuit_testing_opened(origin_circuit_t *circ)
static void
circuit_testing_failed(origin_circuit_t *circ, int at_last_hop)
{
if (server_mode(get_options()) && check_whether_orport_reachable())
return;
log_info(LD_GENERAL,
"Our testing circuit (to see if your ORPort is reachable) "
"has failed. I'll try again later.");
"has failed. Considering launching another one.");
if (!circuit_enough_testing_circs())
consider_testing_reachability(1, 0);
/* These aren't used yet. */
(void)circ;