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Update circuit_timeout test to use deterministic prng

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This commit is contained in:
Nick Mathewson 2019-03-18 09:41:59 -04:00 committed by David Goulet
parent d3526d3f2c
commit 64d5ed0415
1 changed files with 4 additions and 16 deletions
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20
src/test/test.c
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@ -12,6 +12,7 @@
#include "lib/crypt_ops/crypto_dh.h"
#include "lib/crypt_ops/crypto_rand.h"
#include "app/config/or_state_st.h"
#include "test/rng_test_helpers.h"
#include <stdio.h>
#ifdef HAVE_FCNTL_H
@ -354,18 +355,6 @@ test_onion_queues(void *arg)
tor_free(onionskin);
}
static crypto_cipher_t *crypto_rand_aes_cipher = NULL;
// Mock replacement for crypto_rand: Generates bytes from a provided AES_CTR
// cipher in <b>crypto_rand_aes_cipher</b>.
static void
crypto_rand_deterministic_aes(char *out, size_t n)
{
tor_assert(crypto_rand_aes_cipher);
memset(out, 0, n);
crypto_cipher_crypt_inplace(crypto_rand_aes_cipher, out, n);
}
static void
test_circuit_timeout(void *arg)
{
@ -397,8 +386,7 @@ test_circuit_timeout(void *arg)
// Use a deterministic RNG here, or else we'll get nondeterministic
// coverage in some of the circuitstats functions.
MOCK(crypto_rand, crypto_rand_deterministic_aes);
crypto_rand_aes_cipher = crypto_cipher_new("xyzzyplughplover");
testing_enable_deterministic_rng();
circuitbuild_running_unit_tests();
#define timeout0 (build_time_t)(30*1000.0)
@ -534,8 +522,8 @@ test_circuit_timeout(void *arg)
circuit_build_times_free_timeouts(&final);
or_state_free(state);
teardown_periodic_events();
UNMOCK(crypto_rand);
crypto_cipher_free(crypto_rand_aes_cipher);
testing_disable_deterministic_rng();
}
/** Test encoding and parsing of rendezvous service descriptors. */